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ARIES IC/测试座/老化座/插座 IC Test and Burn-In Socket |
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ARIES 测试座产品型录
| 24-3554-18 |
28-3554-18 |
32-3554-18 |
36-3554-18 |
| 40-3554-18 |
42-3554-18 |
44-3554-18 |
48-3554-18 |
| A448-6554-10 |
A440-6554-14 |
A432-6554-10 |
A428-6554-10 |
| A424-6554-10 |
HighFrequency(RF) |
PGAandOtherProduct |
Correct-A-Chip(Adaptors) |
| CableAssemblies |
ProgrammingDevices |
Display(Verti)Sockets |
DIP/SIPSockets&Headers |
| ZIFandTestSockets |
BGASocketsforText,ZIF&Burn-In |
10015ZIFSOIC&TSOPSOCKETS44 |
| 1008-10012ZIFPLCCSOCKETS84 |
100-10007ZIFPLCCSOCKETS44、20、28、32、52、68&84 |
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| 注：适配座/测试座均为易耗品,无保用 |
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